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@article{Coupland2013CoherenceSI, title={Coherence scanning interferometry: linear theory of surface measurement.}, author={Jeremy Coupland and Rahul Mandal and Kanik Palodhi and Richard K. Leach}, journal={Applied optics}, year={2013}, volume={52 16}, pages={ 3662-70 }, url={https://api.semanticscholar.org/CorpusID:7805183}}
  • J. Coupland, Rahul Mandal, R. Leach
  • Published in Applied Optics 1 June 2013
  • Engineering, Physics

A difference between the filter characteristics derived in each case is found and the equivalence of the two approaches when applied to a weakly scattering object is explained.

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61 Citations

Highly Influential Citations

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Methods Citations

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61 Citations

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Coherence scanning interferometry (CSI) is a well-established technique for measuring surface topography based on the coherence envelope and phase of interference fringes. The most commonly used

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When applied to the measurement of smooth surfaces, coherence scanning interferometry can be described by a three-dimensional linear filtering operation that is characterized either by the

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Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics.
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  • 2014

A new method of calibration and adjustment using a silica micro-sphere as a calibration artifact is introduced and a straightforward method to correct for phase and amplitude imperfections in the TF is described using a modified inverse filter.

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3D modeling of coherence scanning interferometry on 2D surfaces using FEM.
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A rigorous simulation model is applied considering both the transfer characteristics of the measurement instrument as well as the geometry and material of different measurement objects to analyze systematic deviations in optical profilers.

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Modeling of interference microscopy beyond the linear regime
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Abstract. Coherence scanning interferometry (CSI), a type of interference microscopy, has found broad applications in the advanced manufacturing industry, providing high-accuracy surface topography

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Vectorial 3D modeling of coherence scanning interferometry
    T. PahlSebastian Hagemeier P. Lehmann

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    Optical Metrology

  • 2021

Coherence scanning interferometry is one of the most frequently used techniques for optical profiling due to its outstanding axial resolution. However, optical profilers suffer from systematic

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Comparison of approximate methods for modelling coherence scanning interferometry
    Helia HooshmandT. Pahl S. Piano

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  • 2023

Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measurement of industrial and biomedical surfaces. The operation of CSI can be modelled using

Universal Fourier optics model for virtual coherence scanning interferometers
    P. LehmannT. PahlJ. Riebeling

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    Optical Metrology

  • 2023

Optical surface topography measurements sometimes suffer from systematic errors. In order to predict such deviations, modeling of optical profilers is a substantial part of the European project

Calibration of coherence scanning interferometry and the effects of defocus
    Rong SuJ. CouplandR. Leach

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  • 2017

Coherence scanning interferometry (CSI) is a well-established technique for 3D measurement of surface topography with sub-nanometre precision in the axial direction. As with most 3D optical imaging

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Fourier optics modelling of coherence scanning interferometers
    P. D. de GrootX. Colonna de LegaRong SuJ. CouplandR. Leach

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  • 2021

We propose an instrument model for coherence scanning interferometry using familiar Fourier optics methods, the spectrum of plane waves, and the assumption that the light source spectral bandwidth is

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28 References

Determination of the point spread function of a coherence scanning interferometer.
    K. PalodhiJ. CouplandR. Leach

    Physics

  • 2011

Coherence scanning interferometry (CSI) combines the lateral resolution of a high power microscope with the axial resolution of an interferometer and provides a rapid and convenient means to measure

  • 3
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Holography, tomography and 3D microscopy as linear filtering operations
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    Physics

  • 2008

In this paper, we characterize 3D optical imaging techniques as 3D linear shift-invariant filtering operations. From the Helmholtz equation that is the basis of scalar diffraction theory, we show

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Application of linear systems theory to characterize coherence scanning interferometry
    Rahul MandalK. PalodhiJ. CouplandR. LeachD. Mansfield

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    Photonics Europe

  • 2012

This paper considers coherence scanning interferometry as a linear filtering operation that is characterised by a point spread function in the space domain or equivalently a transfer function in the

  • 24
Depth-resolved Imaging and Displacement Measurement Techniques Viewed as Linear Filtering Operations
    P. D. RuizJ. M. HuntleyJ. Coupland

    Engineering, Physics

  • 2011

The last 5years have seen the emergence of a family of optical interferometric techniques that provide deformation measurements throughout three-dimensional (3-D) weakly scattering materials. They

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  • PDF
Surface measurement errors using commercial scanning white light interferometers
    F. GaoR. LeachJ. PetzingJ. Coupland

    Physics, Engineering

  • 2007

This paper examines the performance of commercial scanning white light interferometers in a range of measurement tasks. A step height artefact is used to investigate the response of the instruments

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Three-dimensional imaging by a microscope
    N. Streibl

    Physics

  • 1985

In transmission microscopy, many objects are three dimensional, that is, they are thicker than the depth of focus of the imaging system. The three-dimensional (3-D) image-intensity distribution

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The measurement of rough surface topography using coherence scanning interferometry.
    J. PetzingJ. CouplandR. Leach

    Materials Science, Engineering

  • 2010

This guide describes good practice for the measurement and characterisation of rough surface topography using coherence scanning interferometry (commonly referred to as vertical scanning white light

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Image formation by inversion of scattered field data: experiments and computational simulation.
    A. FercherH. BarteltH. BeckerE. Wiltschko

    Physics

    Applied optics

  • 1979

Since in the experimental situation the scattered field data can only be determined in a very restricted range, a distinct smear of the PSF of this imaging process results, and the consequences of this drawback are described in terms of this PSF.

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High-speed noncontact profiler based on scanning white-light interferometry.
    L. DeckPeter J. de Groot

    Physics, Engineering

    Applied optics

  • 1994

A system for fast three-dimensional profilometry, of both optically smooth and optically rough surfaces, based on scanning white-light techniques, using an efficient algorithm to extract and save only the region of interference, substantially reducing both the acquisition and the analysis times.

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Three-dimensional structure determination of semi-transparent objects from holographic data
    E. Wolf

    Physics

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